Force measurements
Source: https://physics-of-life.tu-dresden.de/research/core-facilities/pol-microscopy/technologies-systems/force-mapping Parent: https://physics-of-life.tu-dresden.de/research/core-facilities/pol-microscopy
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Bruker JPK NanoWizard 4XP AFM Lumicks C-Trap Optical Tweezers
Bruker JPK NanoWizard 4XP AFM
In combination with a Zeiss LSM900 confocal fluorescence microscope
Applications:
- Topography imaging, micro-rheology
- Force spectroscopy
- Molecular manipulation
Specs and Equipment:
- Atomic resolution
- Up to 150 lines/s scan speed; fast scan head: 630 lines / s, > 10 fps
- Scan range 100x100x15 μm3 XYZ (tip-scanning)
- Motorized precision stage (20x20 mm2, <2 μm repeatability)
- Contact-, Tapping-, force modulation-, and easy imaging modes: "PeakForce Tapping" and "QI-Imaging"
- Force spectroscopy/molecular manipulation
- Measurements in air or fluids
- Petri dish heater – temperature control for fluid samples.
- Confocal laser scanning fluorescence microscopy possible simultaneous to AFM imaging
- Transmitted light microscopy contrast methods (e.g. bright field, phase contrast, Hoffman modulation or DIC) possible simultaneous to AFM imaging
- "Direct Overlay" option for precise alignment of AFM and optical images
- Data processing software
Zeiss LSM900:
- Stand: Zeiss Observer 7 (inverted)
- Scanhead: Galvo Scanner
- Illumination: laser: 405, 488, 561, 639 nm
- Whitelight LED for DIA/TL widefield imaging
- Detection: GaAsP PMTs, T-PMT
Lumicks C-Trap Optical Tweezers
- LUMICKS Generation 2 dual-trap optical tweezers
- fast detectors
- 3-color confocal laser scanning for simultaneous fluorescence measurement
- temperature control