Metadata
Title
Central Laboratories Directorate
Category
undergraduate
UUID
d79e83ed40d6434fa6f5f12870330507
Source URL
https://www.sharjah.ac.ae/en/Services/Departments/Central-Laboratories-Directora...
Parent URL
https://www.sharjah.ac.ae/en/Services/Departments/Central-Laboratories-Directora...
Crawl Time
2026-03-24T05:59:36+00:00
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Central Laboratories Directorate

Source: https://www.sharjah.ac.ae/en/Services/Departments/Central-Laboratories-Directorate/ph Parent: https://www.sharjah.ac.ae/en/Services/Departments/Central-Laboratories-Directorate/TS

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Applied Physics Laboratories
No. Test/ Service Name Equipment Available Remarks
1 NDT Flaw Detection (Ultrasound) Ultrasonic Flaw Detector Using Frequency shift
2 NDT (Ultrasound) Characterization of biomedical and engineering materials High Voltage Pulser/receiver Wide range of transducers covering frequencies from 24kHz to 20 MHz We are capable of measuring bulk and shear modulus for biological samples & engineering solid & porous materials. We also can characterize the properties of jells, foams and brittle structure. Measurements are done noninvasively with sample sizes, shapes.
3 NDT Multi-layer Thickness measurements Ultrasonic thickness gauge We can measures layer thickness down to mm scales, including paintings coatings etc.
4 Noise assessment Digital Noise Meter Nor140 Sound Analyzer Noise source identification with markers and sound recording Environmental noise assessment    Sound power  Noise Nuisance Recorder
5 Noise prediction and Mapping KadnA Noise mapping Software Calculation, presentation, assessment and prediction of environmental noise.
6 EMC RF & EMF Spectrum-Analyzer Spectran NF-5020 Spectran HF-6080 1Hz – 1 MHz (NF) 10 MHz – 10 GHz (HF) Portable EMC, RF and EMF hand-held  spectrum analyzer
7 Optical properties of  thin and thick semiconductor film Spectrophotometer
8 Electric and  Opto-electric  properties  of thin films Kiethley assemblies equipment.Such as : Kiethley 2425 programmable for measuring I-V characteristic junction
9 Non-destructive Elemental analysis of solids using mirco-XRF Horiba XGT-7200 micor-XRF system Elements from Mg to U in concentrations of 10s of ppm to 100%
10 Light absorption and transmission Acton Research spectrometers and Janis cryostat Wavelength range of 300-1500nm and temperature range of 10-350k
11 Thermal conduction Hot-Disk Instrument Preparation  of some samples might require additional cost
12 Thermal Expansion Linear thermal expansion. Measurement Setup Preparation  of some samples might require additional cost
13 Elemental material Testing XRF Archeological Material Forensic Material Toys, commercial objects testing for hazardous materials
14 Linux/Open Source Training Computers *Training material on how to create open source freeware educational Material *Optimizing Scientific desktop for best productivity *Setting up school/enterprise server for educational purposes
15 Computational Time Provided Parallel Computing facility Prices negotiable. We provide number crunching capabilities Also, we can setup parallel computing facility from commodity computing.

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