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Yale University
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general
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https://cbic.yale.edu/instruments-listing?field_instrument_type_value=Structural...
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https://cbic.yale.edu/instruments
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Yale University

Source: https://cbic.yale.edu/instruments-listing?field_instrument_type_value=Structural%20Science&field_instrument_location_value=All&sort_by=title&sort_order=ASC Parent: https://cbic.yale.edu/instruments

Instrument Catalog

Instrument Type

Instrument Location

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**Chemical Crystallography User Policy**

Short Name: Small Molecule Diffraction Policy

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Structural Science

Instrument Location: KCL 7

Date of Acquisition: September 2013

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Co-authorship suggestions

Please note that single crystal diffraction/model prices do not fluctuate based on effort or time and are not waived even if the diffraction model warrants co-authorship. Should you publish data collected in our center, please acknowledge our facility in your manuscripts or grant applications as follows:

This research made use of the Chemical and Biophysical Instrumentation Center at Yale University (RRID:SCR_021738).

Dr. Mercado is available to assist with the diffraction components of experiments and review manuscripts. Co-authorship should be considered if:

  1. The structural information in the report is derived primarily from diffraction data and constitutes a significant part of the writing.
  2. The structure determination is non-routine, such as involving variable temperature studies, phase changes, or specialized collection environments.
  3. The final structure required a substantial amount of time and technical expertise. For instance:
  4. Problematic twinning or significant disorder in structure refinement.
  5. Careful consideration of anomalous dispersion (e.g., absolute stereochemistry).
  6. Determination of the model by MicroED.

Center Use Policy

DLS Dynamic Light Scattering Wyatt DynaPro PlateReader II

Short Name: DLS

Instrument Type: Scattering, Instrument Type: Solution Biophysics, Instrument Type: Structural Science

Instrument Location: KCL 3

Date of Acquisition: October 2013

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Dynamic light scattering measures the diffusion rate of molecules or particles in solution by observing the fluctuations in scattered light from a laser passing through a sample. The sensitivity of DLS increases with increasing molecular size, with a typical lower size limit of 0.5 nanometers and upper size limit of 10 micrometers.

Typical applications for DLS include:

The DynaPro PlateReader II is set up to make these measurements in 96, 384, or 1536 well plates using as little as 5 microliters of sample.

Standard Operating Procedure

Pilatus3R HPC on a 007 VHF+Arc)Sec X-ray Source

Short Name: 007c

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Structural Science

Instrument Location: KCL 7

Date of Acquisition: October 2016

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The Pilatus3R 200KA detector on our Rigaku 007 HF+ rotating anode with VHF Arc)Sec optics is suitable for solving small molecules samples. This instrument is open to usage by students and staff. λ = 0.7107 Å

Rigaku CCD on 007HF+ X-ray Source

Short Name: 007a

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Structural Science

Instrument Location: KCL 7

Date of Acquisition: October 2009

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The hybrid pixel array detector on our Rigaku 007 HF+ rotating anode X-ray source with HF optics is suitable for solving small-molecule and protein structures by single-crystal X-ray diffraction.  This instrument can also be used to screen crystals before sending them to an x-ray beam line at a synchrotron. λ = 1.5418 Å

Rigaku CCD on 007HF+Arc)Sec X-ray Source

Short Name: 007b

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Structural Science

Instrument Location: KCL 7

Date of Acquisition: June 2016

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The Rigaku Saturn 944HG CCD detector on our Rigaku 007 HF+ rotating anode X-ray source with HF Arc)Sec optics is suitable for solving small molecules samples. This instrument is run by the CBIC Staff. λ = 1.5418 Å

Rigaku MiniFlex600 Powder X-ray Diffractometer

Short Name: PXRD

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Structural Science

Instrument Location: KCL 11

Date of Acquisition: December 2004

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This powder diffractometer can characterize crystallinity, crystal phases, and, in many cases, the identity of solid samples. Our instrument has a sealed-tube copper X-ray source, a scintillation counter with high dynamic range, and Bragg-Brentano geometry with slits providing high resolution for flat powder samples. λ = 1.5418 Å

Rigaku XtaLAB Mini II with a hybrid pixel detector

Short Name: mini2

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Structural Science

Instrument Location: KCL 11

Date of Acquisition: May 2022

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The XtaLabMini II is a fully functional benchtop single-crystal X-ray diffractometer with a CCD detector. λ = 0.7107 Å

Rigaku XtaLAB Synergy, Dualflex, HyPix-Arc 100

Short Name: syn

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Structural Science

Instrument Location: KCL 11

Date of Acquisition: January 2023

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Copper and silver X-ray sources are available. The curved image plate detector allows high dynamic range and collection out to a 2Θ angle of 144 degrees in a single image to yield high-resolution single-crystal data.

TTP Lab-tech Nanoliter Pipetting System

Short Name: Mosquito

Instrument Type: Structural Science

Instrument Location: SCL 26

Date of Acquisition: October 2009

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TTP Labtech’s mosquito allows for the creation of protein crystallization screens with several multi-component drops per well, even in 96-well hanging drop set-ups.

Xenocs Xeuss 3.0 Small/Wide X-ray Scattering System

Short Name: SAXSWAXS

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Scattering, Instrument Type: Solution Biophysics, Instrument Type: Structural Science

Instrument Location: SCL 26

Date of Acquisition: December 2022

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The Xeuss 3.0 offers a maximum flexibility of measurement configurations to get the best possible data quality on any type of sample.

In particular, the following key features enable the user to optimize experiments or results:

XT H 225 Computed Tomography Scanner

Short Name: microCT

Instrument Type: Imaging, Instrument Type: Structural Science

Instrument Location: SCL 26

Date of Acquisition: May 2018

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Micro-CT is a 3D imaging technique utilizing X-rays to see inside an object, slice by slice.  Micro-CT, also called microtomography or micro computed tomography, is similar to hospital CT or “CAT” scan imaging but on a small scale with greatly increased resolution. Samples can be imaged with pixel sizes as small as ~4 micron and objects can be scanned up to ~50 cm in diameter.

The versatile XT H 225 scanner can be used to cover a wide range of applications, including the inspection of plastic parts, electronics and complex mechanisms as well as researching materials and natural specimens.

The scanner can be fit with a rotating anode, reflection, or transmission target. The rotating anode produces the most X-rays, which is good for highly absorbing material, but has the lowest resolution. The transmission target has the best resolution, but produces the least amount of X-rays. The reflection target is typically installed and has a balance between X-ray intensity and resolution.  If your needs require the rotating or transmission target, please inquire in advance about scheduling.

XtaLAB Synergy-ED

Short Name: Synergy-ED

Instrument Type: Diffraction (X-ray and electron), Instrument Type: Imaging, Instrument Type: Scattering, Instrument Type: Structural Science

Instrument Location: KCL 7

Date of Acquisition: January 2025

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The Synergy-ED is a state-of-the-art electron diffractometer designed for Microcrystal Electron Diffraction (MicroED) / 3D Electron Diffraction (3DED) experiments. It enables high-resolution structural analysis of nanocrystalline materials that are too small for conventional X-ray diffraction techniques.

Key Features

Wavelength:

Operates at an electron wavelength of ~0.0251 Å with a 200 kV accelerating voltage, providing high-resolution diffraction data.

Temperature Range:

Capable of measuring samples from room temperature down to 100 K, allowing for studies of temperature-dependent structural changes.

Viable Grain Size:

Suitable for nanocrystals and microcrystals ranging from several hundred nanometers to less than 10 microns.

Sample Types

The Synergy-ED is optimized for a broad range of crystalline materials, including:

Applications

The Synergy-ED provides critical structural insights across multiple fields, including:

Pharmaceutical Research:

Materials Science & Nanotechnology:

Heterogeneous Sample Analysis: