Talos F200i – Cryo-EM

Source: https://cryoem.iitm.ac.in/talos-f200i/ Parent: https://cryoem.iitm.ac.in/

Talos F200i

Key Specifications

• Accelerating voltage: 200 kV
• Electron source: X-FEG (eXtended-field emission gun)

Detectors:

• Ceta 16M CMOS camera
• Panther Segmented Detector for STEM
• Energy-dispersive X-ray spectroscopy (EDS) compatible (Dual-X) retractable detectors
• Imaging mode: TEM, STEM and Diffraction
• Software: Velox, EPU-D, Tomo5, Inspect 3D & Avizo for visualization

Holders:

• Single Tilt
• Low Background Double Tilt HiVis
• Tomography
• Cryo Holders (Single Tilt – Gatan Elsa Cryo Transfer Holder Model 698 & Double Tilt Liquid Nitrogen Cryo Transfer Holder Model 915)

Applications

• TEM and Cryo-TEM
• HRTEM
• STEM and Cryo-STEM
• Energy-dispersive X-ray spectroscopy (EDS)
• Selected area Electron Diffraction (SAED)
• Tomography

Applications

• Transmission Electron Microscopy
• STEM
• EDS Mapping
• Tomography

Transmission Electron Microscopy

TEM (Transmission Electron Microscopy) provides high-resolution imaging to study the crystal structure, and internal features of materials. It is commonly used to analyze lattice fringes, grain boundaries, defects, phase distributions, and nanoparticle/ Clusters size/shape (metals). TEM is ideal for examining thin films, biological samples at cryogenic temperatures, and materials that require detailed structural visualization at high contrast.

STEM

STEM enables sub-nanometer to near-atomic resolution imaging through focused electron scanning. Using HAADF, BF, and DF detectors, STEM provides Z-contrast, atomic-column imaging, and detailed visualization of interfaces, defects, dislocations, and low-contrast materials. STEM is widely used for nanomaterials, semiconductors, catalysts, and cryo-preserved soft materials, especially when correlating structural and chemical information.

EDS Mapping

EDS offers elemental identification and quantitative chemical mapping at high spatial resolution. With dual large-area detectors (100 mm2), it enables fast, high-sensitivity compositional analysis of multi-element samples such as alloys, catalysts, semiconductor devices, and complex nanostructures. EDS is essential for understanding element distribution, interface chemistry, contamination, dopants, and compositional gradients in materials.

Tomography

Using the Talos F200i, tomography enables:

• 3D reconstruction of nanoparticles, clusters, and catalyst materials
• Visualization of internal porosity, voids, and complex architectures
• Accurate measurement of particle shape, volume, and surface morphology
• Mapping of phase distribution and interfaces within heterogeneous materials
• Analysis of defects, dislocation networks, and grain boundary geometry
• Cryo-tomography of biological samples with preserved ultrastructure
• Correlative S/TEM tomography, combining HAADF-STEM and BF/DF imaging for complementary structural information