# Talos F200i – Cryo-EM

**Source**: https://cryoem.iitm.ac.in/talos-f200i/
**Parent**: https://cryoem.iitm.ac.in/

## Talos F200i

## Key Specifications

- Accelerating voltage: **200 kV**
- Electron source: **X-FEG (eXtended-field emission gun)**

Detectors:

- Ceta 16M CMOS camera
- Panther Segmented Detector for STEM
- Energy-dispersive X-ray spectroscopy (EDS) compatible (Dual-X) retractable detectors
- Imaging mode: TEM, STEM and Diffraction
- Software: Velox, EPU-D, Tomo5, Inspect 3D & Avizo for visualization

Holders:

- Single Tilt
- Low Background Double Tilt HiVis
- Tomography
- Cryo Holders
  (Single Tilt – Gatan Elsa Cryo Transfer Holder Model 698 &
  Double Tilt Liquid Nitrogen Cryo Transfer Holder Model 915)

## Applications

- TEM and Cryo-TEM
- HRTEM
- STEM and Cryo-STEM
- Energy-dispersive X-ray spectroscopy (EDS)
- Selected area Electron Diffraction (SAED)
- Tomography

## Applications

- Transmission Electron Microscopy
- STEM
- EDS Mapping
- Tomography

## Transmission Electron Microscopy

TEM (Transmission Electron Microscopy) provides high-resolution imaging to study the crystal structure, and internal features of materials. It is commonly used to analyze lattice fringes, grain boundaries, defects, phase distributions, and nanoparticle/ Clusters size/shape (metals). TEM is ideal for examining thin films, biological samples at cryogenic temperatures, and materials that require detailed structural visualization at high contrast.

## STEM

STEM enables sub-nanometer to near-atomic resolution imaging through focused electron scanning. Using HAADF, BF, and DF detectors, STEM provides Z-contrast, atomic-column imaging, and detailed visualization of interfaces, defects, dislocations, and low-contrast materials. STEM is widely used for nanomaterials, semiconductors, catalysts, and cryo-preserved soft materials, especially when correlating structural and chemical information.

## EDS Mapping

EDS offers elemental identification and quantitative chemical mapping at high spatial resolution. With dual large-area detectors (100 mm2), it enables fast, high-sensitivity compositional analysis of multi-element samples such as alloys, catalysts, semiconductor devices, and complex nanostructures. EDS is essential for understanding element distribution, interface chemistry, contamination, dopants, and compositional gradients in materials.

## Tomography

Using the Talos F200i, tomography enables:

- 3D reconstruction of nanoparticles, clusters, and catalyst materials
- Visualization of internal porosity, voids, and complex architectures
- Accurate measurement of particle shape, volume, and surface morphology
- Mapping of phase distribution and interfaces within heterogeneous materials
- Analysis of defects, dislocation networks, and grain boundary geometry
- Cryo-tomography of biological samples with preserved ultrastructure
- Correlative S/TEM tomography, combining HAADF-STEM and BF/DF imaging for complementary structural information