Metadata
Title
Browse by Research Project Code
Category
general
UUID
9d0f7b7566cb499b817bdd37fd900ebb
Source URL
https://eprints.gla.ac.uk/view/project_code/24419.html
Parent URL
https://eprints.gla.ac.uk/view/project_code/
Crawl Time
2026-03-11T08:20:40+00:00
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Browse by Research Project Code

Source: https://eprints.gla.ac.uk/view/project_code/24419.html Parent: https://eprints.gla.ac.uk/view/project_code/

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Browse by Research Project Code

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Scott, J. ORCID: https://orcid.org/0000-0001-6701-6515, Docherty, F.T., MacKenzie, M., Smith, W. ORCID: https://orcid.org/0000-0002-7909-9220, Miller, B., Collins, C.L. and Craven, A.J. (2006) Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling. Journal of Physics: Conference Series, 26(1), pp. 223-226. (doi: 10.1088/1742-6596/26/1/053)

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