# Browse by Research Project Code

**Source**: https://eprints.gla.ac.uk/view/project_code/24419.html
**Parent**: https://eprints.gla.ac.uk/view/project_code/

\

# Browse by Research Project Code

[Up a level](https://eprints.gla.ac.uk/view/project_code/)

Export as ASCII CitationBibTeXDublin CoreEndNoteHTML CitationPlain TextRefWorksReferReference Manager

[Atom](https://eprints.gla.ac.uk/cgi/exportview/project_code/24419/Atom/24419.xml)  [RSS 1.0](https://eprints.gla.ac.uk/cgi/exportview/project_code/24419/RSS/24419.rss)  [RSS 2.0](https://eprints.gla.ac.uk/cgi/exportview/project_code/24419/RSS2/24419.xml)

[Scott, J.](https://eprints.gla.ac.uk/view/author/7050.html) [ORCID: https://orcid.org/0000-0001-6701-6515](https://orcid.org/0000-0001-6701-6515), [Docherty, F.T.](https://eprints.gla.ac.uk/view/author/5326.html), [MacKenzie, M.](https://eprints.gla.ac.uk/view/author/9271.html), [Smith, W.](https://eprints.gla.ac.uk/view/author/12825.html) [ORCID: https://orcid.org/0000-0002-7909-9220](https://orcid.org/0000-0002-7909-9220), [Miller, B.](https://eprints.gla.ac.uk/view/author/2706.html), Collins, C.L. and [Craven, A.J.](https://eprints.gla.ac.uk/view/author/1905.html)
(2006)
[Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling.](https://eprints.gla.ac.uk/52636/)
*[Journal of Physics: Conference Series](https://eprints.gla.ac.uk/view/journal_volume/Journal_of_Physics=3A_Conference_Series.html)*, 26(1),
pp. 223-226.
(doi: [10.1088/1742-6596/26/1/053](https://doi.org/10.1088/1742-6596/26/1/053))

This list was generated on **Wed Mar 11 08:20:38 2026 GMT**.